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Probe tips. Tip radius 200 nm, W whisker (pack of five)
Five probe tips (tip radius 200 nm- W whisker)
Price On Request £0.00 Add to basket -
Probe tips. Tip radius 500nm, W whisker (pack of five)
Replacement probe tips for MM3A-EM micromanipulator.
Price On Request £0.00 Add to basket -
Probe with curved hook tip and round handle
Value-Tec VP5 probe with curved hook tip, round handle – 410 stainless steel (each)
£2.42 Add to basket -
Probe with sharp curved hook tip and round handle
Value-Tec VP6 probe with sharp curved hook tip, round handle – 410 stainless steel (each)
£2.42 Add to basket -
prober shuttle mounting kit for second microscope
Prober shuttle mounting kit for second microscope. Upgrade kit for using the prober shuttle on a second microscope. The kit contains an electrical feedthrough and vacuum-side LCMK cables for the prober shuttle as well as a vacuum flange.
Price On Request £0.00 Add to basket -
prober shuttle mounting kit for second microscope
Prober shuttle mounting kit for second microscope. Upgrade kit for using the prober shuttle on a second microscope. The kit contains an electrical feedthrough and vacuum-side LCMK cables for the prober shuttle as well as a vacuum flange.
Price On Request £0.00 Add to basket -
Prober shuttle with eight probers and three axis substage
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics in a 19″ electronics rack, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles, iProbe control software and an operator’s handbook.
Price On Request £0.00 Add to basket -
Prober shuttle with two probers (upgradeable to four probes)
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform. A low-current measurement kit is integrated into each manipulator. The system includes control electronics, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles and an operator’s handbook.
Price On Request £0.00 Add to basket -
Prober shuttle with two probers and three axis substage (upgradeable to four probes)
An electrical characterisation system for electron microscopy. The system contains the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three axis substage. A low-current measurement kit is integrated into each manipulator. The system includes control electronics, a joypad, a vacuum flange, a vacuum feedthrough, sample probe needles and an operator’s handbook.
Price On Request £0.00 Add to basket -
ProbeWorkstation with 8 Probes and Current Imaging Module
ProbeWorkstation with Eight Probes and Current Imaging Module – A powerful- dedicated probing solution for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 24 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket -
ProbeWorkstation with eight probes
ProbeWorkstation with Eight Probes. A powerful dedicated probing solution, for in-situ or ex-situ. The system is comprised of eight of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier as well as iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack, 24 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
Price On Request £0.00 Add to basket -
ProbeWorkstation with four probes
ProbeWorkstation with four Probes. A powerful dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current, low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier, as well as iProbe.All of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – Vacuum flange and vacuum feedthrough- Full rack- 12 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius.System documentation.
Price On Request £0.00 Add to basket -
ProbeWorkstation with four probes (on PS8 platform)
ProbeWorkstation with Four Probes (on PS8 Platform). A powerful, dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier- iProbeAll of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – A vacuum flange and vacuum feedthrough- A full rack- Twelve pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius- System documentation
Price On Request £0.00 Add to basket -
ProbeWorkstation with six probes
ProbeWorkstation with Six Probes – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket -
ProbeWorkstation with six probes and current imaging module
ProbeWorkstation with Six Probes and Current Imaging Module – A powerful- dedicated probing solution — for in-situ or ex-situ. The system is comprised of six of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current- low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes the Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- a Tip Cleaning module- Keithley remote control- an EBIC/EBAC amplifier- a Current Imaging module- as well as iProbe – all of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. A vacuum flange and vacuum feedthrough- a full rack- 18 pre-cleaned- individually vacuum packed probe tips with 150 nm tip radius and system documentation are also included.
Price On Request £0.00 Add to basket