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ProbeWorkstation with four probes
ProbeWorkstation with four Probes. A powerful dedicated probing solution for in-situ or ex-situ. The system is comprised of four of the latest generation of probers (MM4-EM) mounted on a load-lock compatible platform with an integrated super-flat three-axis substage. The system is capable of low-current, low-capacity measurements and is enhanced by the Advanced Probing Tools software and hardware suite. The APT suite includes:- Live Contact Tester- Safe Tip Approach- Tip2Tip Tester- Fast Transistor Characterisation- Tip Cleaning module- Keithley remote control- EBIC/EBAC amplifier, as well as iProbe.All of which are operated from a unified graphic user interface installed on the included PC which is accessed using the microscope’s peripherals. – Vacuum flange and vacuum feedthrough- Full rack- 12 pre-cleaned, individually vacuum packed probe tips with 150 nm tip radius.System documentation.