FIB low profile stubs

Micro to Nano low profile pin stubs have been especially developed for FIB-SEM applications to bring specimens closer to the pole piece of FIB-SEM systems to enable low working distances. They are available as flat, vertical and complementary tilt versions of the standard Ø12.7mm pin stub. The complimentary tilt version allow positioning of the specimen  surface flat under the FIB column without the need to tilt the stage. The tilt angle is relative to the vertical electron beam column of the FIB/SEM.

Stubs are made from vacuum grade aluminium and they are fully compatible with standard pin stubs for storage and handling.

Available in the following types:

  • Low profile, flat, horizontal pin mount with standard or short pin
  • Low profile, 90°, vertical pin mount with standard or short pin
  • 38° complimentary angle pin mount for FEI DualBeam and FIB/SEMs
  • 36° complimentary angle pin mount for Zeiss CrossBeam and FIB/SEMs
  • 35° complimentary angle pin mount for Tescan Lyra and VELA FIBxSEMs

Examples of low profile stubs

Product   

Angle

FIB-SEM

Diameter

Standard Pin

Short Pin

Grooved side

10-002112

FEI, Tescan

Ø12.7mm

V

10-002114

90°

FEI, Tescan

Ø12.7mm

V

V

10-002115

35°

Tescan

Ø12.7mm

V

V

10-002118

38°

FEI, Tescan

Ø12.7mm

V

V

10-003112

Zeiss

Ø12.7mm

V

10-003114

90°

Zeiss

Ø12.7mm

V

V

10-003116

36°

Zeiss

Ø12.7mm

V

V


 

Ordering information: