Carbon stubs
Standard SEM stubs are mainly manufactured from vacuum grade aluminium and sometimes brass. This is fine for many applications if the specimen is large and can be mounted directly of the stub. When imaging small samples, powders, particles in solution and fibres the material of the stub can interfere with backscattered electron imaging or X-ray micro-analysis. To avoid such interference, it is better to mount the specimen on an EM-Tec high purity carbon (graphite) specimen stub. The high purity graphitised carbon, which is used for these carbon SEM stubs, contains less than 2ppm impurities with 1ppm or less for each single element. The impurities can be B, Mg, Al, Si, Ca or Fe.
Available carbon high purity SEM specimen mounts are:
- Ø12.7mm standard pin stub
- Ø15mm Hitachi mount with M4 threaded hole
- Ø25mm Hitachi mount with M4 threaded hole
Ordering information:
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EM-Tec high purity carbon SEM pin stub Ø12.7mm top x 8mm L – standard pin
EM-Tec high purity carbon SEM pin stub Ø12.7mm top x 8mm L – standard pin (each)
£1.88 Add to basket -
EM-Tec high purity carbon SEM pin stub Ø12.7mm top x 8mm long
EM-Tec high purity carbon SEM pin stub Ø12.7mm top x 8mm long, standard pin (pkg/10)
£11.29 Add to basket -
EM-Tec high purity carbon Hitachi SEM sample stub – Ø15 x 6mm x M4
EM-Tec high purity carbon Hitachi SEM sample stub – Ø15 x 6mm x M4 (each)
£2.77 Add to basket -
EM-Tec high purity carbon Hitachi SEM stub, Ø15 x 6mm x M4
EM-Tec high purity carbon Hitachi SEM sample stub, Ø15 x 6mm x M4 (pkg/10)
£16.46 Add to basket -
EM-Tec high purity carbon Hitachi SEM stub, Ø25 x 6mm x M4
EM-Tec high purity carbon Hitachi SEM sample stub, Ø25 x 6mm x M4 (each)
£4.38 Add to basket -
EM-Tec high purity carbon Hitachi SEM sample stub – Ø25 x 6mm x M4
EM-Tec high purity carbon Hitachi SEM sample stub – Ø25 x 6mm x M4 (pkg/10)
£40.18 Add to basket