Carbon stubs

Standard SEM stubs are mainly manufactured from vacuum grade aluminium and sometimes brass. This is fine for many applications if the specimen is large and can be mounted directly of the stub. When imaging small samples, powders, particles in solution and fibres the material of the stub can interfere with backscattered electron imaging or X-ray  micro-analysis. To avoid such interference, it is better to mount the specimen on an EM-Tec high purity carbon (graphite) specimen stub. The high purity graphitised carbon, which is used for the EM-Tec carbon SEM stubs, contains less than 2ppm impurities with 1ppm or less for each single element. The impurities can be B, Mg, Al, Si, Ca or Fe.

The available carbon high purity SEM specimen mounts are:

  • Ø12.7mm standard pin stub
  • Ø15mm Hitachi mount with M4 threaded hole
  • Ø25mm Hitachi mount with M4 threaded hole

Ordering information: