EDX Checker
The EM-Tec EDX-Checker has been developed as a cost-efficient tool for quick and easy checking of calibration, performance, and resolution of an EDX system on an SEM. Regular use of the EDX-Checker ensures optimum performance of the EDX detector. The EM-Tec EDX-Checker consists of a standard aluminium SEM pin stub with Ni grids and the reference materials C, PTFE, Mn, Co, AISI 316L and Al/Cu embedded in a vacuum compatible epoxy resin. The EDX-Checker is polished down to 0.5um and coated with carbon. The additional boron nitride is not carbon coated.
- Quick and easy EDX calibration and performance check
- Ideal for EDX systems from EDAX, Thermo, Bruker, Oxford Instruments, IXRF, Phenom and JEOL
- Polished surface – no topography artefacts with the reference materials
- Available in two versions
- Known and consistent take-off angle due to polished surface
- Hexagonal white BN does not need conductive carbon coating
- Low magnification image and X-ray mapping calibration
- Compact and cost effective
- Available as a pin stub and with adaptors for JEOL and Hitachi SEMs
 EDX-Checker with pin stored in tube
 EDX-Checker with JEOL Ø25mm adaptor
EDX-Checker with Hitachi M4 adaptor
EM-Tec EDX-Checker is available in three versions for all brands of SEM:
- EDX-Checker S-7Â with C, PTFE, Mn, Co and Al/Cu as reference materials and Ni grids with 400 plus 1000 mesh for quick magnification, calibration and mapping check. Ideally suited for table top SEMs with EDS.
- EDX-Checker S8Â with C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check. Ideally suited for table top SEMs with EDS.
- EDX-Checker LE-10Â with BN, C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and a 400 mesh nickel grid for quick magnification calibration and mapping check. Optimised for low element performance checking.
Purpose of reference materials in the EM-Tec EDX-Checker:
Material | Purpose of reference material | S-7 | S-8 | LE-10 |
C | Light element EDX detector performance test for carbon | X | X | Â X |
BN | Light element EDX detector performance test for boron and nitrogen | X | ||
PTFE | Light element test and resolution for fluorine | X | X | X |
Al/Cu | EDX system calibration with aluminium and copper peaks | X | X | X |
Mn | EDX-detector resolution check for Mn Kα Peak | X | X | X |
Co | EDX-detector resolution check and linearity | X | X | X |
AISI 316L | Quantitative analysis check | X | X | |
400 mesh Ni | Quick magnification check / mapping | X | X | X |
1000 mesh Ni | Quick magnification check / mapping | X | X |
Ordering information:
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EM-Tec EDX-Checker S-7_H
EM-Tec EDX-Checker S-7 with Hitachi M4 adaptor for standard aluminium pin stub
£497.58 Add to basket -
EM-Tec EDX-Checker S-7_J
EM-Tec EDX-Checker S-7 with Ø 25 x10mm JEOL adaptor for standard aluminium pin stub
£497.58 Add to basket -
EM-Tec EDX-Checker S-7_P
EM-Tec EDX-Checker S-7 on Ø12.7 mm standard aluminium pin stub
£483.09 Add to basket -
EM-Tec EDX-Checker S-8_H
EM-Tec EDX-Checker S-8 with Hitachi M4 adapter for standard aluminium pin stub
£582.13 Add to basket -
EM-Tec EDX-Checker S-8_J
EM-Tec EDX-Checker S-8 with Ø 25 x10mm JEOL adapter for standard aluminium pin stub
£594.20 Add to basket -
EM-Tec EDX-Checker S-8_P
EM-Tec EDX-Checker S-8 on Ø12.7 mm standard aluminium pin stub
£579.71 Add to basket -
EM-Tec EDX-Checker LE-10_H
EM-Tec EDX-Checker LE-10 with Hitachi M4 adapter for standard aluminium pin stub
£700.48 Add to basket -
EM-Tec EDX-Checker LE-10_J
EM-Tec EDX-Checker LE-10 with Ø 25 x10mm JEOL adapter for standard aluminium pin stub
£700.48 Add to basket -
EM-Tec EDX-Checker LE-10_P
EM-Tec EDX-Checker LE-10, Ø12.7 mm standard aluminium pin stub
£685.99 Add to basket