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EM-Tec ST1 STEM imaging holder for SEM

EM-Tec ST1 STEM imaging holder facilitates STEM imaging of TEM specimens in an SEM or FESEM. EM-Tec ST1 STEM imaging holder uses the Everhart-Thornley SE detector in the SEM chamber. A TEM grid is placed in the STEM imaging holder and the holder is positioned under the electron beam (typically in de centre of the SEM stage).  The TEM specimen is scanned with the electron beam and the STEM image is formed by converting the transmitted electrons, which hit the platinum conversion plate, into secondary electrons.  The secondary electrons (holding the STEM image information) are collected by the SE detector in the specimen chamber. It is advised to use high accelerating voltages (25-30kV) and thin specimens to increase  the transmitted electron signal. The STEM imaging detector is provided with a black conductive plastic electron absorption sleeve which is placed between the polepiece and the EM-Tec ST1 STEM imaging holder. The sleeve absorbs the secondary and backscattered electrons emitting from the specimen surface.

Constructed from vacuum grade aluminium, brass TEM grid holder, platinum electron conversion plate and conductive plastic sleeve. Platinum is used for the conversation due to its high secondary electron signal, stability and corrosion resistance. The STEM imaging holder provides a genuine signal from the converted transmitted electrons, resulting in high contrast STEM imaging

Capacity, size and compatibility of the EM-Tec ST1 STEM imaging holder:

Product numbers



Dimensions w/o pin

Grid holding method

SEM stage compatibility


EM-Tec ST1

1 x 3.05 TEM grid



Standard 3.2mm pin


EM-Tec ST1

1 x 3.05 TEM grid



M4 thread

*) The height of the EM-Tec ST1 STEM imaging holder is 29.5mm; with the electron absorption sleeve the height increases to 37.5mm.

The EM-Tec ST1 STEM imaging holder is a cost effective method to add STEM capabilities to your SEM for a fraction of the cost of a dedicated STEM holder and detector for your SEM. The STEM imaging holder image quality rivals that of a dedicated STEM detector system. The limiting factors are specimen thickness and accelerating voltage of the SEM.


EM-Tec ST1 STEM imaging holder

Cobalt nano particles monolayer dispersion