EM-Tec TEM grid holders for SEM

TEM samples are very thin and therefore do not exhibit signal originating from their bulk. This enables improved surface imaging and increased spatial resolution. These are clear advantages for SEM/EDX studies of thin films, fine dispersions, inclusions, precipitations and low-Z materials. An SEM or rather FE-SEM can also be used to check TEM samples or lamellas made with a FIB before inserting into a TEM.
There are two methods for imaging TEM samples and they require different types of TEM grid holders:

• Surface imaging and investigation require TEM grid holders
• STEM imaging which requires a special TEM grid holder with integrated conversion plate

EM-Tec TEM grids holders enable investigation of TEM samples in an SEM. An EM-Tec grid holder can also be used to quickly check the specimen (after FIB procedures) before investigating it with a TEM. EM-Tec grid holders are intended for use in an SEM, Auger, SIMS and light microscopes. They are all precision machined from vacuum grade aluminium.

There are four types of EM-Tec TEM grid holder:

• EM-Tec TG4 SEM pin stub-based TEM grid for up to four TEM grids. Numbered positions with machined pockets and side grooves for loading/unloading TEM  grids. The TEM grids are clamped down by the top plate and a central brass screw. Through-hole size is Ø2.1mm with a 60° side angle on top and base to reduce electron and X-ray scattering interference from the holder. Available in aluminium and copper. Overall size is Ø18×3.2mm with a 15mm long standard 3.2mm pin. The longer pin creates a distance from the stage adaptor to reduce electron and X-ray signals from the SEM stage. Additionally available with stub adaptors for Hitachi M4 thread and JEOL Ø 12.2 and Ø 25mm SEM stubs.
• EM-Tec TG6 pin stub-based TEM grid for up to six TEM grids. Numbered positions with machined pockets and side grooves for loading/unloading TEM grids. The TEM grids are clamped down by the top plate and a central brass screw. Through-hole size is Ø2.1mm with a 60° side angle on top and base to reduce electron and X-ray scattering interference from the holder. Available in aluminium and copper. Overall size is Ø25×3.2mm with a 15mm long standard 3.2mm pin. The longer pin creates a distance from the stage adaptor to reduce electron and X-ray signals from the SEM stage. Additionally available with stub adaptors for Hitachi M4 thread and JEOL Ø 12.2 and Ø 25mm stubs.
• EM-Tec PS11 mini pin stub holder for a single TEM grid or FIB grid. The TEM grid rim rests on a ledge; in the middle of the cavity there is dimple to provide a non-touching area for the mesh of the grid. A groove is provided for easy loading/unloading of the TEM grid with fine tweezers. The TEM grid is not clamped. This holder is recommended for quickly checking a TEM grid in the SEM or as a TEM grid holder for a carbon evaporator.
• EM-Tec PS14 mini pin stub holder for four TEM grids or FIB grids. The TEM grid rim rests on a ledge; in the middle of each cavity there is dimple to provide a non-touching area for the mesh of the grid. Grooves are provided for easy loading/unloading of the TEM grids with fine tweezers. The TEM grids are not clamped. This holder is used for quickly checking  up to four TEM grids in the SEM or as a grid holder for a carbon evaporator.

All four types of EM-Tec TEM grid holders are only available with a standard 3.2mm pin. They can be used on other SEMs, when a suitable EM-Tec SEM stub adaptor is used.

Capacity, size and compatibility of pin based EM-TEM grid holders:

Ordering information